Microelectronic Manufacturing Yield, Reliability, and Failure Analysis
- ISBN-10
- 0819426482
- ISBN-13
- 9780819426482
- Pages
- 218
- Language
- English
- Published
- 1997
- Publisher
- SPIE
Get the book
Other editions
-
- 1995
- 284 pages
- Paperback
- Society of Photo Optical