Physics-of-Failure Based Handbook of Microelectronic Systems

Physics-of-Failure Based Handbook of Microelectronic Systems
ISBN-10
1933904291
ISBN-13
9781933904290
Category
Electronic apparatus and appliances
Pages
271
Language
English
Published
2008
Publisher
RIAC
Author
Shahrzad Salemi

Description

Guotao Wang, Steven Groothuis and Paul S. Ho, “Packaging Effect on Reliability for Cu/Low-k Structure”, ... “Impact of Junction Temperature on Microelectronics Device Reliability and Considerations for Space Applications”, ...

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