In-situ Electron Microscopy: Applications in Physics, Chemistry and Materials Science

In-situ Electron Microscopy: Applications in Physics, Chemistry and Materials Science
ISBN-10
3527319735
ISBN-13
9783527319732
Category
Science
Pages
402
Language
English
Published
2012-05-29
Publisher
John Wiley & Sons
Authors
James M. Howe, Gerhard Dehm, Josef Zweck

Description

Adopting a didactical approach from fundamentals to actual experiments and applications, this handbook and ready reference covers real-time observations using modern scanning electron microscopy and transmission electron microscopy, while also providing information on the required stages and samples. The text begins with introductory material and the basics, before describing advancements and applications in dynamic transmission electron microscopy and reflection electron microscopy. Subsequently, the techniques needed to determine growth processes, chemical reactions and oxidation, irradiation effects, mechanical, magnetic, and ferroelectric properties as well as cathodoluminiscence and electromigration are discussed.

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